Low Noise High Resolution DAC
SP1060
The LNHR DAC is a multi-channel voltage source with outstanding noise and resolution performance. It is designed to drive high-ohmic gates in fundamental physics experiments at cryogenic temperatures. For such experiments, ultra-stable DC bias voltages and high-resolution sweep-voltages with very low fluctuations are necessary. The output range of ±10 V, combined with the 24-bit resolution, allows adjusting the voltages with a step size of only 1.2 μV. The LNHR DAC can be used for DC-biasing, ramping/sweeping, and low-frequency waveform generation. The device is controlled locally by the rotary/push knob (encoder) or remotely using the TCP/IP or RS-232 interfaces. The LCD on the front panel displays the actual voltages.
The LNHR DAC is the ideal instrument for low-noise setups. The output ground is isolated from the case and the computer interface to avoid ground loops. The ground is thus provided by the shield of the cable coming from the experiment.
LNHR DACII key features
12 or 24 independent DAC channels
24-bit resolution
1.2 µV stepsize in the entire ±10 V output range
Integrated output noise 0.3 µVrms
Ultra-low drift 1 μV/ °C + 1.5 ppm/ °C
Floating output ground
Up to 10 mA output current
100 Hz and 100 kHz switchable bandwidth
AWG functionality
Adaptive fast scans
Real-Time 2D Gate Scan
The LNHR DAC II enables fast 2D gate scans with a 100kHz bandwidth and 10µs update rate. This video demonstrates a real-time adaptive 2D gate scan with 50,000 points (50 × 1000), shown at actual live speed.
Adaptive scans actively correct and compensate for capacitive coupling between gates.
All Python/QCoDeS tools used for generating these scans, along with the full driver and additional resources, are available on our GitHub.
Adaptive 2D gate scan with 50000 points, shown at actual live speed.
Gate Leakage Current Measurement Box
SP1046
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Installed between the LNHR DAC output and the sample
Monitors currents during a running experiment
6 channels in parallel
pA to 10 µA range
Does not increase the gate voltage noise or deteriorate the stability
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